In scanning electron microscopy, an electron beam passes through a very thin slice of a specimen and then falls onto a photographic plate or a fluorescent screen.

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NISHI KHANDELWAL · Accepted Answer

Final Answer : False, Explanation :  In scanning electron microscopy (SEM), an electron beam scans the surface of a specimen, and the emitted electrons from the specimen's surface are collected to form an image, rather than passing through the specimen as described.

In scanning electron microscopy, an electron beam passes through a very thin slice of a specimen and then falls onto a photographic plate or a fluorescent screen.

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